Acquisition of Desktop Scanning Electron Microscope (SEM) with Glovebox Compatibility

To support these objectives, NRC requires an SEM instrument that’s small, efficient, high throughput with advanced analysis features including 3D topography and can be integrated into existing glovebox systems, enabling direct in situ analysis without exposing samples to ambient conditions. This capability will enhance the quality of research outputs and accelerate the development of next-generation lithium battery technologies as well as ensure the NRC remains at the forefront of materials analysis and characterization techniques